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   Home > People > Saenger
M.Sc. Mario Saenger
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Conferences

2009   2008   2007   2006   2005  


   

2009:

    23. IR to UV ellipsometric characterization of silicon nitride thin films on textured Si wafers
M. F. Saenger, M. Sch�del, T. Hofmann, J. Hilfiker, J. Sun, T. E. Tiwald, M. Schubert, and J. A. Woollam
5th Workshop Ellipsometry, Zweibr�cken, Germany, March (2009)


    22. Characterizing AntiReflection Coatings on Textured Mono-Crystalline Silicon with Spectroscopic Ellipsometry
J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam
34th IEEE Photovoltaic Specialists Conference, Philadelphia, PA, June (2009)


    21. Spectroscopic ellipsometry analysis of anti-reflection coatings on textured Si wafers
F. Saenger, C. M. Herzinger, M. Sch�del, T. Hofmann, J. Hilfiker, J. Sun andT. E. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, USA, December (2009)


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2008:

    20. Magnetic birefringence and bandgap anisotropy in Zn1-xMnxSe at RT
M. F. Saenger, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, T. Hofmann,, and M. Schubert
E-Week Graduate Poster Session, Lincoln, NE, April 25 (2008)


    19. Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells
M. F. Saenger, J. Sun, M. Sch�del, J. Hilfiker, M. Schubert, and J. A. Woollam
17th International Materials Research Conference, Canc�n, Mexico, August (2008)


    18. Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Sch�del, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, MA, December (2008)


    17. Magnetically induced optical chirality in ZnMnSe
M.F. Saenger, M. Hetterich, X. Liu, J.K. Furdyna, T. Hofmann, R. Skomski, D.J. Sellmyer, and M. Schubert
53rd Magnetism and Magnetic Materials Conference, Austin, TX, November (2008)


    16. Magnetooptic birefringence and bandgap anisotropy in Zn1-xMnxSe at room temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
MRS Fall Meeting, Boston, MA, December (2008)


    15. Magnetooptic birefringence and bandgap anisotropy in ZnMnSe at Room Temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November (2008)


    14. Invited Institute Colloquium
Ellipsometry and the optical Hall effect in harnessing materials for energy conversion and efficiency

M. Schubert, J. A. Woollam, J. Hilfiker, M. Saenger, E. Schubert, T. Hofmann, and C. M. Herzinger
National Renewable Energy Laboratory (NREL), Golden, Colorado, June (2008)


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2007:

    13. Terahertz to UV Generalized Magnetooptic ellipsometry on ZnMnSe: Giant Kerr effect, band-to-band transitions, and charge transport parameters
M. F. Saenger, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    12. Dielectric and magnetic birefringence in Zn1-xMnxSe
M. F. Saenger, D. J. Sellmyer, R. D. Kirby, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, Lincoln, NE, October (2007)


    11. THz to UV Generalized Magnetooptic Ellipsometry on Chlorine-Doped ZnMnSe: Giant Kerr Effect, Band-to-Band Transitions and Charge Transport Parameters
M. F. Saenger, L. Hartmann, H. Schmidt, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
TMS 2007 Electronic Materials Conference, Notre Dame, IN, June (2007)


    10. Polaron-phonon interaction in charge intercalated tungsten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    9. Generalized Mueller matrix Ellipsometry of 3-D spherical photonic bandgap structures
H. Wang, D. Schmidt, M. Saenger, M. Schubert, and Y.F. Lu
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    8. Polaron and phonon properties in WO3 thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    7. Comparison of giant Faraday effects in ZnMnSe and ZnMnO studied by magneto-optic ellipsometry
M. F. Saenger, L. Hartmann, H. Schmidt, M. Hetterich, M. Lorenz, H. Hochmuth, M. Grundmann, T. Hofmann, and and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    6. Phonon and polaron properties of charge intercalated WO3
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, CA, August (2007)


    5. Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates
L. Hartmann, Q. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, M. Grundmann, P. Esquinazi, M. F. Saenger, T. Hofmann, M. Schubert, and S. Liou
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    4. Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy
V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert
2007 E-MRS Spring Meeting, Strasbourg, France, May (2007)


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2006:

    3. Optical properties of colored tungsten oxide sputtered thin films
M. F. Saenger, T. Hofmann, T. H�ing, and M. Schubert
4th Ellipsometry Workshop, Berlin, February (2006)


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2005:

    2. Optische Bestimmung der Eigenschaften freier Ladungstr�ger in TCO-D�nnfilmen
C. Bundesmann, M. Saenger, T. Hofmann, and M. Schubert
TCOs f�r D�nnschichtsolarzellen und andere Anwendungen, Freyburg, April (2005)


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generated using Sembib V0.1 © T. Hofmann (2003) last database entry from 2024-09-30