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Philipp K�hne and Alex Boosalis were awarded the 2013 Ellipsometry Focus Topic Award at the AVS 60th international symposium. The awardees were chosen by the Focus Topic Programm Committee for the best contributed papers given by a graduate student or young post-doc researcher. Philipp was awarded for his talk on "Optical Hall Effect - Detection of Symmetric and Anti-Symmetric Landau-Level Transitions in Multilayer Epitaxial Graphene on C-face SiC". Alex gave a presentation about "A Physical Model Dielectric Function for Graphene from the THz to the UV". The Ellipsometry Focus Topic Award at the AVS 60th international symposium are sponsored by the J.A.Woollam Co., Inc. of Lincoln, Nebraska.
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